You are in:Home/Publications/“Non—homogenity effects and noise sources in SOI MOSFET’s” First Conference in NOISE in advanced microelectronic devices”, Grenoble, France.

Dr. Mohamed Tarek Hasan Mohamed Elewa :: Publications:

Title:
“Non—homogenity effects and noise sources in SOI MOSFET’s” First Conference in NOISE in advanced microelectronic devices”, Grenoble, France.
Authors: B. BOUKRISS, T. ELEWA, A. CHOVET and S. CRISTOLOVEANU
Year: 1990
Keywords: Not Available
Journal: Not Available
Volume: Not Available
Issue: Not Available
Pages: Not Available
Publisher: Not Available
Local/International: International
Paper Link: Not Available
Full paper Not Available
Supplementary materials Not Available
Abstract:

Google ScholarAcdemia.eduResearch GateLinkedinFacebookTwitterGoogle PlusYoutubeWordpressInstagramMendeleyZoteroEvernoteORCIDScopus