You are in:Home/Publications/“Detailed charge pumping evaluation of SIMOX using gated P-I-N diodes” IEEE SOS/SOI Technology Conference, Stateline, Nevada, USA, pp. 148—149.

Dr. Mohamed Tarek Hasan Mohamed Elewa :: Publications:

Title:
“Detailed charge pumping evaluation of SIMOX using gated P-I-N diodes” IEEE SOS/SOI Technology Conference, Stateline, Nevada, USA, pp. 148—149.
Authors: T. OUISSE T. ELEWA, S. CRISTOLOVEANU, H. HADDARA, G. BOREL and D. IOANNOU
Year: 1989
Keywords: Not Available
Journal: Not Available
Volume: Not Available
Issue: Not Available
Pages: Not Available
Publisher: Not Available
Local/International: International
Paper Link: Not Available
Full paper Not Available
Supplementary materials Not Available
Abstract:

Google ScholarAcdemia.eduResearch GateLinkedinFacebookTwitterGoogle PlusYoutubeWordpressInstagramMendeleyZoteroEvernoteORCIDScopus