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Dr. Mohamed Tarek Hasan Mohamed Elewa :: Publications: |
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| Title: | “Interface properties and recombination mechanisms in SIMOX structures” published in Physics and Technology of Amorphous Si02, Plenum Press (R.A.B. Devine Ed.), New York, pp. 553—556. |
| Authors: | T. ELEWA, H. HADDARA, and S. CRISTOLOVEANU |
| Year: | 1988 |
| Keywords: | Not Available |
| Journal: | Not Available |
| Volume: | Not Available |
| Issue: | Not Available |
| Pages: | Not Available |
| Publisher: | Not Available |
| Local/International: | International |
| Paper Link: | Not Available |
| Full paper | Not Available |
| Supplementary materials | Not Available |
| Abstract: |
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