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Dr. Eslam Yahya :: Publications:

Design techniques for variability mitigation
Authors: Shady Agwa, Eslam Yahya, Yehea Ismail
Year: 2013
Keywords: Not Available
Journal: Not Available
Volume: Not Available
Issue: Not Available
Pages: Not Available
Publisher: Not Available
Local/International: International
Paper Link: Not Available
Full paper Eslam Yahya_BHIT_Pap2.pdf
Supplementary materials Not Available

As the fabrication technology migrated towards the nanometre scale, 22 nm and beyond, yield enhancement has become one of the challenges facing the integrated circuits design community. Delay and power consumption of the manufactured chips deviate from their predesigned values due to process, voltage and temperature (PVT) variations. This deviation can lead to a considerable loss in yield and reliability. In this paper, we classify and survey the approaches developed to mitigate the PVT variations on the circuit and ...

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